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Электронный каталог: Liang, C. D. - Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Diele...
Liang, C. D. - Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Diele...
Статья
Автор: Liang, C. D.
IEEE Transactions on Nuclear Science: Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Diele...
б.г.
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Автор: Liang, C. D.
IEEE Transactions on Nuclear Science: Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Diele...
б.г.
ISBN отсутствует
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Статья
Liang, C.D.
Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Dielectrics / C.D.Liang, [et al.] // IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.6. – p.1227-1238. – URL: http://dx.doi.org/10.1109/TNS.2018.2828080. – Bibliogr.:76.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Liang, C.D.
Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs with HfO&sub(2) Gate Dielectrics / C.D.Liang, [et al.] // IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.6. – p.1227-1238. – URL: http://dx.doi.org/10.1109/TNS.2018.2828080. – Bibliogr.:76.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
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