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Электронный каталог: Zalm, P. C. - Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers
Zalm, P. C. - Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers
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Статья
Автор: Zalm, P. C.
Nuclear Instruments & Methods in Physics Research B: Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers
б.г.
ISBN отсутствует
Автор: Zalm, P. C.
Nuclear Instruments & Methods in Physics Research B: Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers
б.г.
ISBN отсутствует
Статья
Zalm, P.C.
Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers / P.C.Zalm, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.387. – p.77-85. – URL: http://dx.doi.org/10.1016/j.nimb.2016.10.004. – Bibliogr.:39.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$
Zalm, P.C.
Quantitative Considerations in Medium Energy Ion Scattering Depth Profiling Analysis of Nanolayers / P.C.Zalm, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.387. – p.77-85. – URL: http://dx.doi.org/10.1016/j.nimb.2016.10.004. – Bibliogr.:39.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$