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Электронный каталог: Yuri, Y. - Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy H...
Yuri, Y. - Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy H...
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Статья
Автор: Yuri, Y.
Nuclear Instruments & Methods in Physics Research A: Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy H...
б.г.
ISBN отсутствует
Автор: Yuri, Y.
Nuclear Instruments & Methods in Physics Research A: Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy H...
б.г.
ISBN отсутствует
Статья
Yuri, Y.
Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy Heavy-Ion Beams / Y.Yuri, [et al.] // Nuclear Instruments & Methods in Physics Research A. – 2016. – Vol.828. – p.15-21. – URL: http://dx.doi.org/10.1016/j.nima.2016.04.055. – Bibliogr.:16.
Спец.(статьи,препринты) = С 345 о1 - Измерение параметров пучка заряженных частиц
Yuri, Y.
Characterization of a Gafchromic Film for the Two-Dimensional Profile Measurement of Low-Energy Heavy-Ion Beams / Y.Yuri, [et al.] // Nuclear Instruments & Methods in Physics Research A. – 2016. – Vol.828. – p.15-21. – URL: http://dx.doi.org/10.1016/j.nima.2016.04.055. – Bibliogr.:16.
Спец.(статьи,препринты) = С 345 о1 - Измерение параметров пучка заряженных частиц