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Электронный каталог: Neale, A. - Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS
Neale, A. - Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS
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Статья
Автор: Neale, A.
IEEE Transactions on Nuclear Science: Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS
б.г.
ISBN отсутствует
Автор: Neale, A.
IEEE Transactions on Nuclear Science: Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS
б.г.
ISBN отсутствует
Статья
Neale, A.
Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS / A.Neale, M.Sachdev // IEEE Transactions on Nuclear Science. – 2016. – Vol.63, No.3, Pt.3. – p.1912-1917. – URL: http://dx.doi.org/10.1109/TNS.2016.2547963. – Bibliogr.:19.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Neale, A.
Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS / A.Neale, M.Sachdev // IEEE Transactions on Nuclear Science. – 2016. – Vol.63, No.3, Pt.3. – p.1912-1917. – URL: http://dx.doi.org/10.1109/TNS.2016.2547963. – Bibliogr.:19.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$