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Электронный каталог: Duncan, A. R. - Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory
Duncan, A. R. - Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory
Статья
Автор: Duncan, A. R.
IEEE Transactions on Nuclear Science: Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory
б.г.
ISBN отсутствует
Автор: Duncan, A. R.
IEEE Transactions on Nuclear Science: Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory
б.г.
ISBN отсутствует
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Статья
Duncan, A.R.
Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory / A.R.Duncan, [a.o.] // IEEE Transactions on Nuclear Science. – 2016. – Vol.63, No.2, Pt.3. – p.1276-83. – URL: http://dx.doi.org/10.1109/TNS.2016.2540803. – Bibliogr.:31.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Duncan, A.R.
Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory / A.R.Duncan, [a.o.] // IEEE Transactions on Nuclear Science. – 2016. – Vol.63, No.2, Pt.3. – p.1276-83. – URL: http://dx.doi.org/10.1109/TNS.2016.2540803. – Bibliogr.:31.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
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IEEE Transactions on Nuclear Science Vol.63, No.2, Pt.3
2016 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ
IEEE Transactions on Nuclear Science Vol.63, No.2, Pt.3
2016 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ