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Электронный каталог: Mu, Y. - Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its A...
Mu, Y. - Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its A...
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Статья
Автор: Mu, Y.
Nuclear Instruments & Methods in Physics Research B: Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its A...
б.г.
ISBN отсутствует
Автор: Mu, Y.
Nuclear Instruments & Methods in Physics Research B: Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its A...
б.г.
ISBN отсутствует
Статья
Mu, Y.
Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its Applications / Y.Mu, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.372. – p.14-28. – URL: http://dx.doi.org/10.1016/j.nimb.2016.01.035. – Bibliogr.:56.
Спец.(статьи,препринты) = С 44 г - Физико-химические методы анализа элементов. Анализ с помощью ядерных методов
Mu, Y.
Real-Time and on-Site g-Ray Radiation Response Testing System for Semiconductor Devices and Its Applications / Y.Mu, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.372. – p.14-28. – URL: http://dx.doi.org/10.1016/j.nimb.2016.01.035. – Bibliogr.:56.
Спец.(статьи,препринты) = С 44 г - Физико-химические методы анализа элементов. Анализ с помощью ядерных методов