Электронный каталог

Статья

Li, X.
Research on the Combined Effects of Ionization and Displacement Defects in NPN Transistors Based on Deep Level Transient Spectroscopy / X.Li, [et al.] // IEEE Transactions on Nuclear Science. – 2015. – Vol.62, No.2. – p.555-564. – URL: http://dx.doi.org/10.1109/TNS.2015.2408331. – Bibliogr.:38.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$