Электронный каталог

Статья

Ko, E.
Effects of Interfacial Suboxides and Dangling Bonds on Tunneling Current Through Nanometer-Thick SiO&sub(2) Layers / E.Ko, [a.o.] // Physical Review B : Condensed Matter and Materials Physics. – 2011. – Vol.84, No.3. – p.033303. – URL: http://dx.doi.org/10.1103/PhysRevB.84.033303. – Bibliogr.:21.



Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$