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Электронный каталог: Meckenstock, R. - Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution i...
Meckenstock, R. - Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution i...
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Статья
Автор: Meckenstock, R.
Review of Scientific Instruments: Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution i...
б.г.
ISBN отсутствует
Автор: Meckenstock, R.
Review of Scientific Instruments: Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution i...
б.г.
ISBN отсутствует
Статья
Meckenstock, R.
Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution in the Nanometer Range / R.Meckenstock // Review of Scientific Instruments. – 2008. – Vol.79, No.4. – p.041101. – URL: http://dx.doi.org/10.1063/1.2908445. – Bibliogr.:81.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$
Meckenstock, R.
Invited Review Article: Microwave Spectroscopy Based on Scanning Thermal Microscopy: Resolution in the Nanometer Range / R.Meckenstock // Review of Scientific Instruments. – 2008. – Vol.79, No.4. – p.041101. – URL: http://dx.doi.org/10.1063/1.2908445. – Bibliogr.:81.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$