Электронный каталог

Статья

Tanaka, T.
Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior / T.Tanaka, [et al.] // IEEE Transactions on Nuclear Science. – 2022. – Vol.69, No.1. – P.35-42. – URL: https://doi.org/10.1109/TNS.2021.3131346. – Bibliogr.:28.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$