Электронный каталог

Статья

Malherbe, V.
Displacement Damage Characterization of CMOS Single-Photon Avalanche Diodes: Alpha-Particle and Fast-Neutron Measurements / V.Malherbe, [et al.] // IEEE Transactions on Nuclear Science. – 2021. – Vol.68, No.5, Pt.1. – p.777-784. – URL: https://doi.org/10.1109/TNS.2021.3071171. – Bibliogr.:25.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$