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Электронный каталог: Mauguet, M. - Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation
Mauguet, M. - Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation
Статья
Автор: Mauguet, M.
IEEE Transactions on Nuclear Science: Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation
б.г.
ISBN отсутствует
Автор: Mauguet, M.
IEEE Transactions on Nuclear Science: Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation
б.г.
ISBN отсутствует
Статья
Mauguet, M.
Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation / M.Mauguet, [et al.] // IEEE Transactions on Nuclear Science. – 2019. – Vol.66, No.7, Pt.2. – p.1516-1522. – URL: https://doi.org/10.1109/TNS.2019.2920842. – Bibliogr.:17.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Mauguet, M.
Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation / M.Mauguet, [et al.] // IEEE Transactions on Nuclear Science. – 2019. – Vol.66, No.7, Pt.2. – p.1516-1522. – URL: https://doi.org/10.1109/TNS.2019.2920842. – Bibliogr.:17.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$