Электронный каталог

Статья

Benites, L.A.C.
Reliability Calculation with Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA / L.A.C.Benites, [et al.] // IEEE Transactions on Nuclear Science. – 2019. – Vol.66, No.7, Pt.2. – p.1433-1440. – URL: https://doi.org/10.1109/TNS.2019.2921796. – Bibliogr.:26.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$