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Электронный каталог: Huang, Y. - An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
Huang, Y. - An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
Статья
Автор: Huang, Y.
IEEE Transactions on Nuclear Science: An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
ISBN отсутствует
Автор: Huang, Y.
IEEE Transactions on Nuclear Science: An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
ISBN отсутствует
Статья
Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure / Y.Huang, [et al.] // IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – p.1532-1539. – URL: https://doi.org/10.1109/TNS.2018.2824402. – Bibliogr.:27.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure / Y.Huang, [et al.] // IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – p.1532-1539. – URL: https://doi.org/10.1109/TNS.2018.2824402. – Bibliogr.:27.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$