Электронный каталог

Статья

Yang, Z.
XTEM Investigation of Recovery on Electrical Degradation of 4H-SiC Schottky Barrier Diode by Swift Heavy *2*0*9Bi Ions Irradiation / Z.Yang, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2017. – Vol.407. – p.304-309. – URL: http://dx.doi.org/10.1016/j.nimb.2017.07.030. – Bibliogr.:20.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$