Электронный каталог

Статья

Tonfat, J.
Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA / J.Tonfat, [et al.] // IEEE Transactions on Nuclear Science. – 2017. – Vol.64, No.8, Pt.1. – p.2161-2168. – URL: https://doi.org/10.1109/TNS.2017.2727479. – Bibliogr.:23.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$