Электронный каталог

Статья

Secondo, R.
Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications / R.Secondo, [et al.] // IEEE Transactions on Nuclear Science. – 2017. – Vol.64, No.8, Pt.1. – p.2107-2114. – URL: https://doi.org/10.1109/TNS.2017.2691403. – Bibliogr.:28.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$