Электронный каталог -Wu, Z. - Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation- Absopac

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Автор: Wu, Z.
IEEE Transactions on Nuclear Science: Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation
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Wu, Z.
Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation / Z.Wu, [et al.] // IEEE Transactions on Nuclear Science. – 2017. – Vol.64, No.1, Pt.2. – p.654-664. – URL: https://doi.org/10.1109/TNS.2016.2633405. – Bibliogr.:41.

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Электронный каталог: Wu, Z. - Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

Wu, Z. - Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

Электронный каталог

Поиск :

Личный кабинет :

Электронный каталог: Wu, Z. - Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

Wu, Z. - Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

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