Электронный каталог

Статья

Moscatelli, F.
Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations / F.Moscatelli, [et al.] // IEEE Transactions on Nuclear Science. – 2016. – Vol.63, No.5, Pt.2. – p.2716-2723. – URL: https://doi.org/10.1109/TNS.2016.2599560. – Bibliogr.:27.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$