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Электронный каталог: Ding, L. - Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications
Ding, L. - Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications
Статья
Автор: Ding, L.
Nuclear Instruments & Methods in Physics Research A: Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications
б.г.
ISBN отсутствует
Автор: Ding, L.
Nuclear Instruments & Methods in Physics Research A: Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications
б.г.
ISBN отсутствует
Статья
Ding, L.
Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications / L.Ding, [et al.] // Nuclear Instruments & Methods in Physics Research A. – 2016. – Vol.831. – p.265-268. – URL: http://dx.doi.org/10.1016/j.nima.2016.03.096. – Bibliogr.:11.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Ding, L.
Radiation Tolerance Study of a Commercial 65 nm CMOS Technology for High Energy Physics Applications / L.Ding, [et al.] // Nuclear Instruments & Methods in Physics Research A. – 2016. – Vol.831. – p.265-268. – URL: http://dx.doi.org/10.1016/j.nima.2016.03.096. – Bibliogr.:11.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$