Электронный каталог

Статья

Vittone, E.
Charge Collection Efficiency Degradation Induced by MeV Ions in Semiconductor Devices: Model and Experiment / E.Vittone, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.372. – p.128-142. – URL: http://dx.doi.org/10.1016/j.nimb.2016.01.030. – Bibliogr.:55.



Спец.(статьи,препринты) = С 344.1м - Полупроводниковые детекторы