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Электронный каталог: Stoytschew, V. - MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter
Stoytschew, V. - MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter
Статья
Автор: Stoytschew, V.
Nuclear Instruments & Methods in Physics Research B: MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter
б.г.
ISBN отсутствует
Автор: Stoytschew, V.
Nuclear Instruments & Methods in Physics Research B: MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter
б.г.
ISBN отсутствует
Статья
Stoytschew, V.
MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter / V.Stoytschew, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.371. – p.194-198. – URL: http://dx.doi.org/10.1016/j.nimb.2015.11.020. – Bibliogr.:10.
Спец.(статьи,препринты) = С 344.1о - Электромагнитные сепараторы изотопов. Сепараторы по времени пролета
Stoytschew, V.
MeV-SIMS Yield Measurements Using a Si-PIN Diode as a Primary Ion Current Counter / V.Stoytschew, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2016. – Vol.371. – p.194-198. – URL: http://dx.doi.org/10.1016/j.nimb.2015.11.020. – Bibliogr.:10.
Спец.(статьи,препринты) = С 344.1о - Электромагнитные сепараторы изотопов. Сепараторы по времени пролета