Электронный каталог

Статья

Zhu, Y.
Micro-Raman Spectroscopy Characterization of Silicon with Different Structures Irradiated with Energetic Bi-Ions / Y.Zhu, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2015. – Vol.365, Pt.A. – p.123-127. – URL: http://dx.doi.org/10.1016/j.nimb.2015.08.041. – Bibliogr.:16.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$