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Электронный каталог: Brugiere, T. - First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: S...
Brugiere, T. - First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: S...
Статья
Автор: Brugiere, T.
Nuclear Instruments & Methods in Physics Research A: First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: S...
б.г.
ISBN отсутствует
Автор: Brugiere, T.
Nuclear Instruments & Methods in Physics Research A: First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: S...
б.г.
ISBN отсутствует
Статья
Brugiere, T.
First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: Study of the EMCMOS Concept / T.Brugiere, [a.o.] // Nuclear Instruments & Methods in Physics Research A. – 2015. – Vol.787. – p.336-339. – URL: http://dx.doi.org/10.1016/j.nima.2015.01.065. – Bibliogr.:12.
Спец.(статьи,препринты) = С 344.1м - Полупроводниковые детекторы
Brugiere, T.
First Measurement of the In-Pixel Electron Multiplying with a Standard Imaging CMOS Technology: Study of the EMCMOS Concept / T.Brugiere, [a.o.] // Nuclear Instruments & Methods in Physics Research A. – 2015. – Vol.787. – p.336-339. – URL: http://dx.doi.org/10.1016/j.nima.2015.01.065. – Bibliogr.:12.
Спец.(статьи,препринты) = С 344.1м - Полупроводниковые детекторы