Поиск :
Личный кабинет :
Электронный каталог: Zujun, W. - Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose ...
Zujun, W. - Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose ...
Статья
Автор: Zujun, W.
IEEE Transactions on Nuclear Science: Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose ...
б.г.
ISBN отсутствует
Автор: Zujun, W.
IEEE Transactions on Nuclear Science: Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose ...
б.г.
ISBN отсутствует
На полку
Статья
Zujun, W.
Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose Rates and Biased Conditions / W.Zujun, [et al.] // IEEE Transactions on Nuclear Science. – 2015. – Vol.62, No.2. – p.527-533. – URL: http://dx.doi.org/10.1109/TNS.2015.2394779. – Bibliogr.:20.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Zujun, W.
Degradation of CMOS APS Image Sensors Induced by Total Ionizing Dose Radiation at Different Dose Rates and Biased Conditions / W.Zujun, [et al.] // IEEE Transactions on Nuclear Science. – 2015. – Vol.62, No.2. – p.527-533. – URL: http://dx.doi.org/10.1109/TNS.2015.2394779. – Bibliogr.:20.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Привязано к:
Доступно
1 из 1