Электронный каталог -Baig, H. - A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability- Absopac

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Автор: Baig, H.
IEEE Transactions on Nuclear Science: A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability
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Baig, H.
A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability / H.Baig, [et al.] // IEEE Transactions on Nuclear Science. – 2014. – Vol.61,No.3, Pt.2. – p.1389-1399. – URL: http://dx.doi.org/10.1109/TNS.2014.2315432. – Bibliogr.:33.

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Электронный каталог: Baig, H. - A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability

Baig, H. - A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability

Электронный каталог

Поиск :

Личный кабинет :

Электронный каталог: Baig, H. - A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability

Baig, H. - A Low-Overhead Multiple-SEU Mitigation Approach for SRAM-Based FPGAs with Increased Reliability

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