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Электронный каталог: Dolph, M. C. - Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool
Dolph, M. C. - Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool
Статья
Автор: Dolph, M. C.
Nuclear Instruments & Methods in Physics Research B: Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool
б.г.
ISBN отсутствует
Автор: Dolph, M. C.
Nuclear Instruments & Methods in Physics Research B: Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool
б.г.
ISBN отсутствует
Статья
Dolph, M.C.
Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool / M.C.Dolph, C.Santeufemio // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2014. – Vol.328. – p.33-41. – URL: http://dx.doi.org/10.1016/j.nimb.2014.02.126. – Bibliogr.:24.
Спец.(статьи,препринты) = С 350 - Приложения методов ядерной физики в смежных областях
Dolph, M.C.
Exploring Cryogenic Focused Ion Beam Milling as a Group III-V Device Fabrication Tool / M.C.Dolph, C.Santeufemio // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2014. – Vol.328. – p.33-41. – URL: http://dx.doi.org/10.1016/j.nimb.2014.02.126. – Bibliogr.:24.
Спец.(статьи,препринты) = С 350 - Приложения методов ядерной физики в смежных областях