Электронный каталог

Статья

Zhang, Y.
Investigation of Unique Total Ionizing Dose Effects in 0.2 *mm Partially-Depleted Silicon-on-Insulator Technology / Y.Zhang, [et al.] // Nuclear Instruments & Methods in Physics Research A : Accelerators,spectrometers,detectors and associated equipment. – 2014. – Vol.745. – p.128-132. – URL: http://dx.doi.org/10.1016/j.nima.2014.01.052. – Bibliogr.:19.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$