Электронный каталог

Статья

Peng, C.
Investigating the Degradation Mechanisms Caused by the TID Effects in 130 nm PDSOI I/O NMOS / C.Peng, [et al.] // Nuclear Instruments & Methods in Physics Research A : Accelerators,spectrometers,detectors and associated equipment. – 2014. – Vol.748. – p.70-78. – URL: http://dx.doi.org/10.1016/j.nima.2014.02.036. – Bibliogr.:23.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$