Электронный каталог -Martin, E. - Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...- Absopac

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Автор: Martin, E.
IEEE Transactions on Nuclear Science: Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...
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Martin, E.
Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Image Sensors / E.Martin, [a.o.] // IEEE Transactions on Nuclear Science. – 2014. – Vol.61,No.1, Pt.3. – p.636-645. – URL: http://dx.doi.org/10.1109/TNS.2013.2297204 . – Bibliogr.:37.

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Электронный каталог: Martin, E. - Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...

Martin, E. - Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...

Электронный каталог

Поиск :

Личный кабинет :

Электронный каталог: Martin, E. - Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...

Martin, E. - Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 *mm CMOS Imag...

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