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Электронный каталог: Weiland, C. - Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray ...
Weiland, C. - Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray ...
Статья
Автор: Weiland, C.
Review of Scientific Instruments: Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray ...
б.г.
ISBN отсутствует
Автор: Weiland, C.
Review of Scientific Instruments: Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray ...
б.г.
ISBN отсутствует
Статья
Weiland, C.
Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray Photoelectron Spectroscopy Using a Hemispherical Electron Analyzer / C.Weiland, [a.o.] // Review of Scientific Instruments. – 2013. – Vol.84, No.3. – p.036106. – URL: http://dx.doi.org/10.1063/1.4795406. – Bibliogr.:8.
Спец.(статьи,препринты) = С 44 г - Физико-химические методы анализа элементов. Анализ с помощью ядерных методов
Weiland, C.
Alignment/Focus Dependent Core-Line Sensitivity for Quantitative Chemical Analysis in Hard x-Ray Photoelectron Spectroscopy Using a Hemispherical Electron Analyzer / C.Weiland, [a.o.] // Review of Scientific Instruments. – 2013. – Vol.84, No.3. – p.036106. – URL: http://dx.doi.org/10.1063/1.4795406. – Bibliogr.:8.
Спец.(статьи,препринты) = С 44 г - Физико-химические методы анализа элементов. Анализ с помощью ядерных методов