Электронный каталог

Статья

Barak, J.
SEU Due to Electrons in Silicon Devices with Nanometric Sensitive Volumes and Small Critical Charge / J.Barak, [et al.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2012. – Vol.287. – p.113-119. – URL: http://dx.doi.org/10.1016/j.nimb.2012.06.011. – Bibliogr.:31.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$