Электронный каталог

Статья

Liu, C.
DLTS Studies of Bias Dependence of Defects in Silicon NPN Bipolar Junction Transistor Irradiated by Heavy Ions / C.Liu, [et al.] // Nuclear Instruments & Methods in Physics Research A : Accelerators,spectrometers,detectors and associated equipment. – 2012. – Vol.688. – p.7-10. – URL: http://dx.doi.org/10.1016/j.nima.2012.05.073. – Bibliogr.:25.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$