Электронный каталог

Статья

Han, J.-W.
Note: Two-Dimensional Resistivity Mapping Method for Characterization of Thin Films and Nanomaterials / J.-W.Han, [a.o.] // Review of Scientific Instruments. – 2011. – Vol.82, No.8. – p.086117. – URL: http://dx.doi.org/10.1063/1.3626797. – Bibliogr.:14.



Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$