Электронный каталог

Статья

Lefevre, J.
Characterization of a Silicon-Related Defect Detected by Its Excited Triplet State in Electron-Irradiated 3C-SiC / J.Lefevre, [a.o.] // Physical Review B : Condensed Matter and Materials Physics. – 2011. – Vol.83, No.7. – p.075201. – URL: http://dx.doi.org/10.1103/PhysRevB.83.075201. – Bibliogr.:48.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$