Электронный каталог

Статья

Kim, W.S.
The Origin of Trap and Effect of Nitrogen Plasma in the Oxide-Nitride-Oxide Structures for Non-Volatile Memory / W.S.Kim, [a.o.] // Journal of the Korean Physical Society. – 2010. – Vol.57, No.2. – p.255-259. – URL: http://dx.doi.org/10.3938/jkps.57.255. – Bibliogr.:10.



Спец.(статьи,препринты) = С 353 - Физика плазмы