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Электронный каталог: Fulkerson, D. E. - A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe He...
Fulkerson, D. E. - A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe He...
Статья
Автор: Fulkerson, D. E.
IEEE Transactions on Nuclear Science: A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe He...
б.г.
ISBN отсутствует
Автор: Fulkerson, D. E.
IEEE Transactions on Nuclear Science: A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe He...
б.г.
ISBN отсутствует
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Статья
Fulkerson, D.E.
A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe Heterojunction Bipolar Transistor Integrated Circuits / D.E.Fulkerson // IEEE Transactions on Nuclear Science. – 2010. – Vol.57,No.1, Pt.2. – p.348-357. – URL: http://dx.doi.org/10.1109/TNS.2009.2038267. – Bibliogr.:21.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Fulkerson, D.E.
A Physics-Based Engineering Methodology for Calculating Soft Error Rates of Bulk CMOS and SiGe Heterojunction Bipolar Transistor Integrated Circuits / D.E.Fulkerson // IEEE Transactions on Nuclear Science. – 2010. – Vol.57,No.1, Pt.2. – p.348-357. – URL: http://dx.doi.org/10.1109/TNS.2009.2038267. – Bibliogr.:21.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
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IEEE Transactions on Nuclear Science Vol.57,No.1, Pt.2
The Institute of Electrical and Electronics Engineers, 02/2010 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ
IEEE Transactions on Nuclear Science Vol.57,No.1, Pt.2
The Institute of Electrical and Electronics Engineers, 02/2010 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ