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Электронный каталог: Gao, X. - Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure
Gao, X. - Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure
Статья
Автор: Gao, X.
Applied Physics Letters: Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure
б.г.
ISBN отсутствует
Автор: Gao, X.
Applied Physics Letters: Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure
б.г.
ISBN отсутствует
Статья
Gao, X.
Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure / X.Gao, [a.o.] // Applied Physics Letters. – 2009. – Vol.95, No.14. – p.144102. – URL: http://dx.doi.org/10.1063/1.3242005. – Bibliogr.:33.
Спец.(статьи,препринты) = С 325.7 - Фуллерены (Сn). Атомные кластеры
Gao, X.
Si Clusters on Reconstructed SiC (0001) Revealed by Surface Extended x-Ray Absorption Fine Structure / X.Gao, [a.o.] // Applied Physics Letters. – 2009. – Vol.95, No.14. – p.144102. – URL: http://dx.doi.org/10.1063/1.3242005. – Bibliogr.:33.
Спец.(статьи,препринты) = С 325.7 - Фуллерены (Сn). Атомные кластеры