Электронный каталог

Статья

Hua, W.
Modeling of Ion Beam Induced Damage in Si During Channeling Rutherford Backscattering Spectrometry Analysis / W.Hua, [a.o.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2009. – Vol.267, No.5. – p.813-816. – URL: http://dx.doi.org/10.1016/j.nimb.2008.12.021. – Bibliogr.:5.



Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$