Электронный каталог

Статья

Han, Y.
Development of an Advanced X-ray Detector for Inspecting Inner Microscopic Structural Details in Industrial Applications / Y.Han, [et al.] // Nuclear Instruments & Methods in Physics Research A : Accelerators,spectrometers,detectors and associated equipment. – 2009. – Vol.600, No.2. – p.440-444. – URL: http://dx.doi.org/10.1016/j.nima.2008.11.143. – Bibliogr.:11.



Спец.(статьи,препринты) = С 344.1с - Детекторы гамма-квантов