Электронный каталог

Статья

Teterev, Yu.G.
Ionization Profile Monitor for Noninvasive Diagnostics of Wide Beams in Applied Research / Yu.G.Teterev, A.T.Issatov, A.I.Krylov, S.V.Mitrofanov, K.D.Timoshenko. – Text : electronic // Nuclear Instruments & Methods in Physics Research A. – 2026. – Vol. 1087. – P. 171394. – URL: https://doi.org/10.1016/j.nima.2026.171394. – Bibliogr.: 24.

This article presents the results of developing an ionization profile monitor (IPM) designed for a wide beam, which collects ionization products from residual gas as a passing beam interacts with it. IPM consists of an extractor, a scanner, and two electrostatic analyzers. The monitor was tested using ion beams of &sup(132)Xe&sup(26+) with an energy of 1.2 MeV/amu and a residual gas pressure of 5 × 10&sup(−4) Pa. It was shown that the monitor allows for accurate measurement of wide beam profiles, achieving a resolution of 1.5 × 1.5 mm&sup(2) and a minimum sensitivity of 5•10&sup(3) particles/cm&sup(2) ‧s. The monitor is designed to ensure uniform beam distribution during transport to the target and to continuously monitor its changes. Two types of monitors have been developed: one for beam diameters of 45 mm for radiobiological research and one for 60 mm for testing radiation effects on electronic equipment.



Спец.(статьи,препринты) = С 345 о - Электронная и ионная оптика. Формирование и анализ пучков
ОИЯИ = ОИЯИ (JINR)2026