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Электронный каталог: Wang, Y. - A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
Wang, Y. - A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
Статья
Автор: Wang, Y.
IEEE Transactions on Nuclear Science: A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
б.г.
ISBN отсутствует
Автор: Wang, Y.
IEEE Transactions on Nuclear Science: A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
б.г.
ISBN отсутствует
Статья
Wang, Y.
A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs / Y.Wang, [et al.] // IEEE Transactions on Nuclear Science. – 2022. – Vol.69, No.6. – P.1249-1256. – URL: https://doi.org/10.1109/TNS.2022.3175954. – Bibliogr.:30.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Wang, Y.
A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs / Y.Wang, [et al.] // IEEE Transactions on Nuclear Science. – 2022. – Vol.69, No.6. – P.1249-1256. – URL: https://doi.org/10.1109/TNS.2022.3175954. – Bibliogr.:30.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$