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Электронный каталог: Liu, C. - Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID
Liu, C. - Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID
Статья
Автор: Liu, C.
IEEE Transactions on Nuclear Science: Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID
б.г.
ISBN отсутствует
Автор: Liu, C.
IEEE Transactions on Nuclear Science: Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID
б.г.
ISBN отсутствует
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Статья
Liu, C.
Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID / C.Liu, [et al.] // IEEE Transactions on Nuclear Science. – 2022. – Vol.69, No.5. – P.1148-1156. – URL: https://doi.org/10.1109/TNS.2021.3138077. – Bibliogr.:45.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Liu, C.
Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TID / C.Liu, [et al.] // IEEE Transactions on Nuclear Science. – 2022. – Vol.69, No.5. – P.1148-1156. – URL: https://doi.org/10.1109/TNS.2021.3138077. – Bibliogr.:45.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
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