Электронный каталог

Статья

Cannon, J.M.
Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons / J.M.Cannon, [et al.] // IEEE Transactions on Nuclear Science. – 2021. – Vol.68, No.5, Pt.1. – p.815-822. – URL: https://doi.org/10.1109/TNS.2021.3061672. – Bibliogr.:30.



Спец.(статьи,препринты) = С 344.3 - Ядерная электроника$