Электронный каталог

Статья

Morita, K.
High Resolution in Situ Li Depth Profiling of Thin Films Stacked Li Ion Batteries Under Charging Conditions by Means of TERD and RBS Techniques with 5 MeV He*+*2 Ion Beam / K.Morita, [et al.] // Nuclear Instruments & Methods in Physics Research B. – 2018. – Vol.437. – p.8-12. – URL: http://dx.doi.org/10.1016/j.nimb.2018.09.043. – Bibliogr.:11.



Спец.(статьи,препринты) = С 345 е2 - Инжекция и захват частиц