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IEEE Transactions on Nuclear Science
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IEEE Transactions on Nuclear Science. – New York : The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022. – URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=23. – Since 2023 - see Electronic Journal. – ISSN 0018-9499.
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IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – P.1433-1972.
Бюллетени = 47/18
IEEE Transactions on Nuclear Science. – New York : The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022. – URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=23. – Since 2023 - see Electronic Journal. – ISSN 0018-9499.
Выпуск
IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – P.1433-1972.
Бюллетени = 47/18
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Периодическое издание
IEEE Transactions on Nuclear Science
The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022 г.
ISBN отсутствует
IEEE Transactions on Nuclear Science
The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022 г.
ISBN отсутствует
Связанные описания:
Статья
Dai, G.
Degradation of KNN-Based Lead-Free Piezoelectric Material Under Gamma Irradiation
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Dai, G.
Degradation of KNN-Based Lead-Free Piezoelectric Material Under Gamma Irradiation
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Статья
Mizuta, E.
Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications
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Mizuta, E.
Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications
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Статья
Tambara, L. A.
Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
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Tambara, L. A.
Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
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Статья
Zhang, H.
Effects of Total-Ionizing-Dose Irradiation on Single-Event Response for Flip-Flop Designs at a 14...
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Zhang, H.
Effects of Total-Ionizing-Dose Irradiation on Single-Event Response for Flip-Flop Designs at a 14...
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Статья
Zheng, Q.
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
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Zheng, Q.
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
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Статья
Balbekov, A. O.
Circuit-Level Layout-Aware Modeling of Single-Event Effects in 65-nm CMOS ICs
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Balbekov, A. O.
Circuit-Level Layout-Aware Modeling of Single-Event Effects in 65-nm CMOS ICs
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Статья
Mitrovic, M.
Experimental Investigation of the Joint Influence of Reduced Supply Voltage and Charge Sharing on...
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Mitrovic, M.
Experimental Investigation of the Joint Influence of Reduced Supply Voltage and Charge Sharing on...
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Статья
Kato, T.
The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
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Kato, T.
The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
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Статья
Correas, V.
Analysis and Modeling of the Charge Collection Mechanism in 28-nm FD-SOI
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Correas, V.
Analysis and Modeling of the Charge Collection Mechanism in 28-nm FD-SOI
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Статья
Cangialosi, C.
Thermal Neutron SRAM Detector Characterization at the CERN Mixed-Field Facility, CHARM
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Cangialosi, C.
Thermal Neutron SRAM Detector Characterization at the CERN Mixed-Field Facility, CHARM
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Статья
Ramos, P.
SEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
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Ramos, P.
SEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
б.г.
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Статья
Maharrey, J. A.
Dual-Interlocked Logic for Single-Event Transient Mitigation
б.г.
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Maharrey, J. A.
Dual-Interlocked Logic for Single-Event Transient Mitigation
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Статья
Jiang, H.
Power-Aware SE Analysis of Different FF Designs at the 14-/16-nm Bulk FinFET CMOS Technology Node
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Jiang, H.
Power-Aware SE Analysis of Different FF Designs at the 14-/16-nm Bulk FinFET CMOS Technology Node
б.г.
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Статья
Lunardi, C.
On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability
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Lunardi, C.
On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability
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Статья
Lindoso, A.
Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation
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Lindoso, A.
Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation
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Статья
Chen, R. M.
Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applica...
б.г.
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Chen, R. M.
Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applica...
б.г.
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Статья
Yamada, K.
Radiation-Hardened Flip-Flops with Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET...
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Yamada, K.
Radiation-Hardened Flip-Flops with Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET...
б.г.
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Статья
Cecchetto, M.
Impact of Thermal and Intermediate Energy Neutrons on SRAM SEE Rates in the LHC Accelerator
б.г.
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Cecchetto, M.
Impact of Thermal and Intermediate Energy Neutrons on SRAM SEE Rates in the LHC Accelerator
б.г.
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Статья
Wu, Z.
Heavy Ion, Proton, and Neutron Charge Deposition Analyses in Several Semiconductor Materials
б.г.
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Wu, Z.
Heavy Ion, Proton, and Neutron Charge Deposition Analyses in Several Semiconductor Materials
б.г.
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Статья
Artola, L.
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
б.г.
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Artola, L.
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
б.г.
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Статья
Mauguet, M.
Single Events Induced by Heavy Ions and Laser Pulses in Silicon Schottky Diodes
б.г.
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Mauguet, M.
Single Events Induced by Heavy Ions and Laser Pulses in Silicon Schottky Diodes
б.г.
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Статья
Manabe, S.
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
б.г.
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Manabe, S.
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
б.г.
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Статья
Liao, W.
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bul...
б.г.
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Liao, W.
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bul...
б.г.
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Статья
Hales, J. M.
Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced...
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Hales, J. M.
Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced...
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Статья
Tali, M.
Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs
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Tali, M.
Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs
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Статья
Bosser, A. L.
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
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Bosser, A. L.
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
б.г.
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Статья
Mateu, I.
ReadMON: A Portable Readout System for the CERN PH-RADMON Sensors
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Mateu, I.
ReadMON: A Portable Readout System for the CERN PH-RADMON Sensors
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Статья
Secondo, R.
System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Techno...
б.г.
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Secondo, R.
System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Techno...
б.г.
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Статья
Inguimbert, C.
In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking
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Inguimbert, C.
In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking
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Статья
Zinoni, C.
Qualification Strategy of New Technologies for Safety Instrumentation in Harsh Radiation Environm...
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Zinoni, C.
Qualification Strategy of New Technologies for Safety Instrumentation in Harsh Radiation Environm...
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Статья
Di Capua, F.
Random Telegraph Signal in Proton Irradiated Single-Photon Avalanche Diodes
б.г.
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Di Capua, F.
Random Telegraph Signal in Proton Irradiated Single-Photon Avalanche Diodes
б.г.
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Статья
Le Roch, A.
Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications
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Le Roch, A.
Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications
б.г.
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Статья
Di Francesca, D.
Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERN
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Di Francesca, D.
Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERN
б.г.
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Статья
Blanchet, T.
X-Ray, Proton, and Electron Radiation Effects on Type I Fiber Bragg Gratings
б.г.
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Blanchet, T.
X-Ray, Proton, and Electron Radiation Effects on Type I Fiber Bragg Gratings
б.г.
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Статья
Kraxner, A.
Investigation of the Influence of Temperature and Annealing on the Radiation Hardness of Silicon ...
б.г.
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Kraxner, A.
Investigation of the Influence of Temperature and Annealing on the Radiation Hardness of Silicon ...
б.г.
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Статья
Morana, A.
Dependence of the Voids-Fiber Bragg Grating Radiation Response on Temperature, Dose, and Dose Rate
б.г.
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Morana, A.
Dependence of the Voids-Fiber Bragg Grating Radiation Response on Temperature, Dose, and Dose Rate
б.г.
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Статья
Girard, S.
Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials
б.г.
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Girard, S.
Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials
б.г.
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Статья
Alessi, A.
Ni-Ion and *g-Ray Irradiated Silica-Based Glasses Characterized by Luminescence and Raman Spectro...
б.г.
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Alessi, A.
Ni-Ion and *g-Ray Irradiated Silica-Based Glasses Characterized by Luminescence and Raman Spectro...
б.г.
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Статья
Sabatier, C.
6-MeV Electron Exposure Effects on OFDR-Based Distributed Fiber-Based Sensors
б.г.
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Sabatier, C.
6-MeV Electron Exposure Effects on OFDR-Based Distributed Fiber-Based Sensors
б.г.
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Статья
Al Helou, N.
Radioluminescence and Optically Stimulated Luminescence Responses of a Cerium-Doped Sol-Gel Silic...
б.г.
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Al Helou, N.
Radioluminescence and Optically Stimulated Luminescence Responses of a Cerium-Doped Sol-Gel Silic...
б.г.
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Статья
Gorine, G.
Ultrahigh Fluence Radiation Monitoring Technology for the Future Circular Collider at CERN
б.г.
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Gorine, G.
Ultrahigh Fluence Radiation Monitoring Technology for the Future Circular Collider at CERN
б.г.
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Статья
Moll, M.
Displacement Damage in Silicon Detectors for High Energy Physics
б.г.
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Moll, M.
Displacement Damage in Silicon Detectors for High Energy Physics
б.г.
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Статья
Irom, F.
A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers
б.г.
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Irom, F.
A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers
б.г.
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Статья
Arruda, L.
Electrons in GEO Measured with the ESA Multifunctional Spectrometer During the January 2014 SEP
б.г.
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Arruda, L.
Electrons in GEO Measured with the ESA Multifunctional Spectrometer During the January 2014 SEP
б.г.
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Статья
Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
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Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
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Статья
Riffaud, J.
TID Response of pMOS Nanowire Field-Effect Transistors: Geometry and Bias Dependence
б.г.
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Riffaud, J.
TID Response of pMOS Nanowire Field-Effect Transistors: Geometry and Bias Dependence
б.г.
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Статья
Wang, P. F.
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
б.г.
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Wang, P. F.
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
б.г.
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Статья
Yang, L.
Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs with ON-State Bias Irradiation
б.г.
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Yang, L.
Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs with ON-State Bias Irradiation
б.г.
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Статья
Emeliyanov, V. V.
Impact of Heavy Ion Energy on Charge Yield in Silicon Dioxide
б.г.
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Emeliyanov, V. V.
Impact of Heavy Ion Energy on Charge Yield in Silicon Dioxide
б.г.
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Статья
Tolleson, B. S.
Improved Model for Excess Base Current in Irradiated Lateral p-n-p Bipolar Junction Transistors
б.г.
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Tolleson, B. S.
Improved Model for Excess Base Current in Irradiated Lateral p-n-p Bipolar Junction Transistors
б.г.
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Статья
Borghello, G.
Dose-Rate Sensitivity of 65-nm MOSFETs Exposed to Ultrahigh Doses
б.г.
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Borghello, G.
Dose-Rate Sensitivity of 65-nm MOSFETs Exposed to Ultrahigh Doses
б.г.
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Статья
Fleetwood, D. M.
Evolution of Total Ionizing Dose Effects in MOS Devices with Moore’s Law Scaling
б.г.
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Fleetwood, D. M.
Evolution of Total Ionizing Dose Effects in MOS Devices with Moore’s Law Scaling
б.г.
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Статья
Ravotti, F.
Dosimetry Techniques and Radiation Test Facilities for Total Ionizing Dose Testing
б.г.
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Ravotti, F.
Dosimetry Techniques and Radiation Test Facilities for Total Ionizing Dose Testing
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Статья
Selected Papers from the 2017 Conference on Radiation and Its Effects on Components and Systems (...
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Selected Papers from the 2017 Conference on Radiation and Its Effects on Components and Systems (...
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