Поиск :
Личный кабинет :
Электронный каталог: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science

Доступно
1 из 1
1 из 1
	 Периодическое издание
 
IEEE Transactions on Nuclear Science. – New York : The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022. – URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=23. – Since 2023 - see Electronic Journal. – ISSN 0018-9499.
Выпуск
 
IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – P.1433-1972.
Бюллетени = 47/18
IEEE Transactions on Nuclear Science. – New York : The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022. – URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?puNumber=23. – Since 2023 - see Electronic Journal. – ISSN 0018-9499.
Выпуск
IEEE Transactions on Nuclear Science. – 2018. – Vol.65, No.8, Pt.1. – P.1433-1972.
Бюллетени = 47/18
| Филиал | Фонд | Всего | Доступно для брони | Доступно для выдачи | Бронирование | 
|---|---|---|---|---|---|
| ЦБ.ЧЗ | 0 | 1 | 1 | 1 | Заказать | 
Привязано к:
 
 
				
          Периодическое издание
IEEE Transactions on Nuclear Science
The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022 г.
ISBN отсутствует
	
	
        
        
	IEEE Transactions on Nuclear Science
The Institute of Electrical and Electronics Engineers, 1956-1998; 2000-2022 г.
ISBN отсутствует
Связанные описания:
 
 
				
          Статья
Dai, G.
Degradation of KNN-Based Lead-Free Piezoelectric Material Under Gamma Irradiation
б.г.
ISBN отсутствует
	
	
        
        
	Dai, G.
Degradation of KNN-Based Lead-Free Piezoelectric Material Under Gamma Irradiation
б.г.
ISBN отсутствует
 
				
          Статья
Mizuta, E.
Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications
б.г.
ISBN отсутствует
	
	
        
        
	Mizuta, E.
Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications
б.г.
ISBN отсутствует
 
				 
				 
				
          Статья
Tambara, L. A.
Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
б.г.
ISBN отсутствует
	
	
        
        
	Tambara, L. A.
Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
б.г.
ISBN отсутствует
 
				
          Статья
Zhang, H.
Effects of Total-Ionizing-Dose Irradiation on Single-Event Response for Flip-Flop Designs at a 14...
б.г.
ISBN отсутствует
	
	
        
        
	Zhang, H.
Effects of Total-Ionizing-Dose Irradiation on Single-Event Response for Flip-Flop Designs at a 14...
б.г.
ISBN отсутствует
 
				
          Статья
Zheng, Q.
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
б.г.
ISBN отсутствует
	
	
        
        
	Zheng, Q.
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
б.г.
ISBN отсутствует
 
				
          Статья
Balbekov, A. O.
Circuit-Level Layout-Aware Modeling of Single-Event Effects in 65-nm CMOS ICs
б.г.
ISBN отсутствует
	
	
        
        
	Balbekov, A. O.
Circuit-Level Layout-Aware Modeling of Single-Event Effects in 65-nm CMOS ICs
б.г.
ISBN отсутствует
 
				
          Статья
Mitrovic, M.
Experimental Investigation of the Joint Influence of Reduced Supply Voltage and Charge Sharing on...
б.г.
ISBN отсутствует
	
	
        
        
	Mitrovic, M.
Experimental Investigation of the Joint Influence of Reduced Supply Voltage and Charge Sharing on...
б.г.
ISBN отсутствует
 
				
          Статья
Kato, T.
The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
б.г.
ISBN отсутствует
	
	
        
        
	Kato, T.
The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
б.г.
ISBN отсутствует
 
				
          Статья
Correas, V.
Analysis and Modeling of the Charge Collection Mechanism in 28-nm FD-SOI
б.г.
ISBN отсутствует
	
	
        
        
	Correas, V.
Analysis and Modeling of the Charge Collection Mechanism in 28-nm FD-SOI
б.г.
ISBN отсутствует
 
				
          Статья
Cangialosi, C.
Thermal Neutron SRAM Detector Characterization at the CERN Mixed-Field Facility, CHARM
б.г.
ISBN отсутствует
	
	
        
        
	Cangialosi, C.
Thermal Neutron SRAM Detector Characterization at the CERN Mixed-Field Facility, CHARM
б.г.
ISBN отсутствует
 
				
          Статья
Ramos, P.
SEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
б.г.
ISBN отсутствует
	
	
        
        
	Ramos, P.
SEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
б.г.
ISBN отсутствует
 
				
          Статья
Maharrey, J. A.
Dual-Interlocked Logic for Single-Event Transient Mitigation
б.г.
ISBN отсутствует
	
	
        
        
	Maharrey, J. A.
Dual-Interlocked Logic for Single-Event Transient Mitigation
б.г.
ISBN отсутствует
 
				
          Статья
Jiang, H.
Power-Aware SE Analysis of Different FF Designs at the 14-/16-nm Bulk FinFET CMOS Technology Node
б.г.
ISBN отсутствует
	
	
        
        
	Jiang, H.
Power-Aware SE Analysis of Different FF Designs at the 14-/16-nm Bulk FinFET CMOS Technology Node
б.г.
ISBN отсутствует
 
				 
				 
				
          Статья
Lunardi, C.
On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability
б.г.
ISBN отсутствует
	
	
        
        
	Lunardi, C.
On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability
б.г.
ISBN отсутствует
 
				
          Статья
Lindoso, A.
Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation
б.г.
ISBN отсутствует
	
	
        
        
	Lindoso, A.
Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation
б.г.
ISBN отсутствует
 
				 
				
          Статья
Chen, R. M.
Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applica...
б.г.
ISBN отсутствует
	
	
        
        
	Chen, R. M.
Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applica...
б.г.
ISBN отсутствует
 
				
          Статья
Yamada, K.
Radiation-Hardened Flip-Flops with Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET...
б.г.
ISBN отсутствует
	
	
        
        
	Yamada, K.
Radiation-Hardened Flip-Flops with Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET...
б.г.
ISBN отсутствует
 
				 
				
          Статья
Cecchetto, M.
Impact of Thermal and Intermediate Energy Neutrons on SRAM SEE Rates in the LHC Accelerator
б.г.
ISBN отсутствует
	
	
        
        
	Cecchetto, M.
Impact of Thermal and Intermediate Energy Neutrons on SRAM SEE Rates in the LHC Accelerator
б.г.
ISBN отсутствует
 
				
          Статья
Wu, Z.
Heavy Ion, Proton, and Neutron Charge Deposition Analyses in Several Semiconductor Materials
б.г.
ISBN отсутствует
	
	
        
        
	Wu, Z.
Heavy Ion, Proton, and Neutron Charge Deposition Analyses in Several Semiconductor Materials
б.г.
ISBN отсутствует
 
				 
				
          Статья
Artola, L.
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
б.г.
ISBN отсутствует
	
	
        
        
	Artola, L.
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
б.г.
ISBN отсутствует
 
				
          Статья
Mauguet, M.
Single Events Induced by Heavy Ions and Laser Pulses in Silicon Schottky Diodes
б.г.
ISBN отсутствует
	
	
        
        
	Mauguet, M.
Single Events Induced by Heavy Ions and Laser Pulses in Silicon Schottky Diodes
б.г.
ISBN отсутствует
 
				 
				 
				
          Статья
Manabe, S.
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
б.г.
ISBN отсутствует
	
	
        
        
	Manabe, S.
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
б.г.
ISBN отсутствует
 
				
          Статья
Liao, W.
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bul...
б.г.
ISBN отсутствует
	
	
        
        
	Liao, W.
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bul...
б.г.
ISBN отсутствует
 
				
          Статья
Hales, J. M.
Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced...
б.г.
ISBN отсутствует
	
	
        
        
	Hales, J. M.
Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced...
б.г.
ISBN отсутствует
 
				
          Статья
Tali, M.
Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs
б.г.
ISBN отсутствует
	
	
        
        
	Tali, M.
Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs
б.г.
ISBN отсутствует
 
				
          Статья
Bosser, A. L.
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
б.г.
ISBN отсутствует
	
	
        
        
	Bosser, A. L.
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
б.г.
ISBN отсутствует
 
				
          Статья
Mateu, I.
ReadMON: A Portable Readout System for the CERN PH-RADMON Sensors
б.г.
ISBN отсутствует
	
	
        
        
	Mateu, I.
ReadMON: A Portable Readout System for the CERN PH-RADMON Sensors
б.г.
ISBN отсутствует
 
				
          Статья
Secondo, R.
System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Techno...
б.г.
ISBN отсутствует
	
	
        
        
	Secondo, R.
System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Techno...
б.г.
ISBN отсутствует
 
				
          Статья
Inguimbert, C.
In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking
б.г.
ISBN отсутствует
	
	
        
        
	Inguimbert, C.
In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking
б.г.
ISBN отсутствует
 
				 
				
          Статья
Zinoni, C.
Qualification Strategy of New Technologies for Safety Instrumentation in Harsh Radiation Environm...
б.г.
ISBN отсутствует
	
	
        
        
	Zinoni, C.
Qualification Strategy of New Technologies for Safety Instrumentation in Harsh Radiation Environm...
б.г.
ISBN отсутствует
 
				
          Статья
Di Capua, F.
Random Telegraph Signal in Proton Irradiated Single-Photon Avalanche Diodes
б.г.
ISBN отсутствует
	
	
        
        
	Di Capua, F.
Random Telegraph Signal in Proton Irradiated Single-Photon Avalanche Diodes
б.г.
ISBN отсутствует
 
				
          Статья
Le Roch, A.
Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications
б.г.
ISBN отсутствует
	
	
        
        
	Le Roch, A.
Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications
б.г.
ISBN отсутствует
 
				
          Статья
Di Francesca, D.
Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERN
б.г.
ISBN отсутствует
	
	
        
        
	Di Francesca, D.
Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERN
б.г.
ISBN отсутствует
 
				
          Статья
Blanchet, T.
X-Ray, Proton, and Electron Radiation Effects on Type I Fiber Bragg Gratings
б.г.
ISBN отсутствует
	
	
        
        
	Blanchet, T.
X-Ray, Proton, and Electron Radiation Effects on Type I Fiber Bragg Gratings
б.г.
ISBN отсутствует
 
				
          Статья
Kraxner, A.
Investigation of the Influence of Temperature and Annealing on the Radiation Hardness of Silicon ...
б.г.
ISBN отсутствует
	
	
        
        
	Kraxner, A.
Investigation of the Influence of Temperature and Annealing on the Radiation Hardness of Silicon ...
б.г.
ISBN отсутствует
 
				
          Статья
Morana, A.
Dependence of the Voids-Fiber Bragg Grating Radiation Response on Temperature, Dose, and Dose Rate
б.г.
ISBN отсутствует
	
	
        
        
	Morana, A.
Dependence of the Voids-Fiber Bragg Grating Radiation Response on Temperature, Dose, and Dose Rate
б.г.
ISBN отсутствует
 
				
          Статья
Girard, S.
Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials
б.г.
ISBN отсутствует
	
	
        
        
	Girard, S.
Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials
б.г.
ISBN отсутствует
 
				
          Статья
Alessi, A.
Ni-Ion and *g-Ray Irradiated Silica-Based Glasses Characterized by Luminescence and Raman Spectro...
б.г.
ISBN отсутствует
	
	
        
        
	Alessi, A.
Ni-Ion and *g-Ray Irradiated Silica-Based Glasses Characterized by Luminescence and Raman Spectro...
б.г.
ISBN отсутствует
 
				
          Статья
Sabatier, C.
6-MeV Electron Exposure Effects on OFDR-Based Distributed Fiber-Based Sensors
б.г.
ISBN отсутствует
	
	
        
        
	Sabatier, C.
6-MeV Electron Exposure Effects on OFDR-Based Distributed Fiber-Based Sensors
б.г.
ISBN отсутствует
 
				
          Статья
Al Helou, N.
Radioluminescence and Optically Stimulated Luminescence Responses of a Cerium-Doped Sol-Gel Silic...
б.г.
ISBN отсутствует
	
	
        
        
	Al Helou, N.
Radioluminescence and Optically Stimulated Luminescence Responses of a Cerium-Doped Sol-Gel Silic...
б.г.
ISBN отсутствует
 
				
          Статья
Gorine, G.
Ultrahigh Fluence Radiation Monitoring Technology for the Future Circular Collider at CERN
б.г.
ISBN отсутствует
	
	
        
        
	Gorine, G.
Ultrahigh Fluence Radiation Monitoring Technology for the Future Circular Collider at CERN
б.г.
ISBN отсутствует
 
				
          Статья
Moll, M.
Displacement Damage in Silicon Detectors for High Energy Physics
б.г.
ISBN отсутствует
	
	
        
        
	Moll, M.
Displacement Damage in Silicon Detectors for High Energy Physics
б.г.
ISBN отсутствует
 
				
          Статья
Irom, F.
A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers
б.г.
ISBN отсутствует
	
	
        
        
	Irom, F.
A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers
б.г.
ISBN отсутствует
 
				
          Статья
Arruda, L.
Electrons in GEO Measured with the ESA Multifunctional Spectrometer During the January 2014 SEP
б.г.
ISBN отсутствует
	
	
        
        
	Arruda, L.
Electrons in GEO Measured with the ESA Multifunctional Spectrometer During the January 2014 SEP
б.г.
ISBN отсутствует
 
				
          Статья
Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
ISBN отсутствует
	
	
        
        
	Huang, Y.
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
б.г.
ISBN отсутствует
 
				
          Статья
Riffaud, J.
TID Response of pMOS Nanowire Field-Effect Transistors: Geometry and Bias Dependence
б.г.
ISBN отсутствует
	
	
        
        
	Riffaud, J.
TID Response of pMOS Nanowire Field-Effect Transistors: Geometry and Bias Dependence
б.г.
ISBN отсутствует
 
				
          Статья
Wang, P. F.
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
б.г.
ISBN отсутствует
	
	
        
        
	Wang, P. F.
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
б.г.
ISBN отсутствует
 
				 
				
          Статья
Yang, L.
Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs with ON-State Bias Irradiation
б.г.
ISBN отсутствует
	
	
        
        
	Yang, L.
Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs with ON-State Bias Irradiation
б.г.
ISBN отсутствует
 
				
          Статья
Emeliyanov, V. V.
Impact of Heavy Ion Energy on Charge Yield in Silicon Dioxide
б.г.
ISBN отсутствует
	
	
        
        
	Emeliyanov, V. V.
Impact of Heavy Ion Energy on Charge Yield in Silicon Dioxide
б.г.
ISBN отсутствует
 
				
          Статья
Tolleson, B. S.
Improved Model for Excess Base Current in Irradiated Lateral p-n-p Bipolar Junction Transistors
б.г.
ISBN отсутствует
	
	
        
        
	Tolleson, B. S.
Improved Model for Excess Base Current in Irradiated Lateral p-n-p Bipolar Junction Transistors
б.г.
ISBN отсутствует
 
				
          Статья
Borghello, G.
Dose-Rate Sensitivity of 65-nm MOSFETs Exposed to Ultrahigh Doses
б.г.
ISBN отсутствует
	
	
        
        
	Borghello, G.
Dose-Rate Sensitivity of 65-nm MOSFETs Exposed to Ultrahigh Doses
б.г.
ISBN отсутствует
 
				
          Статья
Fleetwood, D. M.
Evolution of Total Ionizing Dose Effects in MOS Devices with Moore’s Law Scaling
б.г.
ISBN отсутствует
	
	
        
        
	Fleetwood, D. M.
Evolution of Total Ionizing Dose Effects in MOS Devices with Moore’s Law Scaling
б.г.
ISBN отсутствует
 
				
          Статья
Ravotti, F.
Dosimetry Techniques and Radiation Test Facilities for Total Ionizing Dose Testing
б.г.
ISBN отсутствует
	
	
        
        
	Ravotti, F.
Dosimetry Techniques and Radiation Test Facilities for Total Ionizing Dose Testing
б.г.
ISBN отсутствует
 
				
          Статья
Selected Papers from the 2017 Conference on Radiation and Its Effects on Components and Systems (...
б.г.
ISBN отсутствует
	
	
        
        
	Selected Papers from the 2017 Conference on Radiation and Its Effects on Components and Systems (...
б.г.
ISBN отсутствует
 Заказать
    Заказать   На полку
    На полку