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Электронный каталог: Holf, M. A. - Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography
Holf, M. A. - Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography
Статья
Автор: Holf, M. A.
Physical Review Letters: Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography
б.г.
ISBN отсутствует
Автор: Holf, M. A.
Physical Review Letters: Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography
б.г.
ISBN отсутствует
Статья
Holf, M.A.
Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography / M.A.Holf, [et al.] // Physical Review Letters. – 2014. – Vol.112, No.16. – p.165502. – URL: http://dx.doi.org/10.1103/PhysRevLett.112.165502. – Bibliogr.:38.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$
Holf, M.A.
Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography / M.A.Holf, [et al.] // Physical Review Letters. – 2014. – Vol.112, No.16. – p.165502. – URL: http://dx.doi.org/10.1103/PhysRevLett.112.165502. – Bibliogr.:38.
Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$