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Электронный каталог: Ristic, G. S. - The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si)
Ristic, G. S. - The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si)
Статья
Автор: Ristic, G. S.
Nuclear Instruments & Methods in Physics Research B: The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si)
б.г.
ISBN отсутствует
Автор: Ristic, G. S.
Nuclear Instruments & Methods in Physics Research B: The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si)
б.г.
ISBN отсутствует
Статья
Ristic, G.S.
The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si) / G.S.Ristic, [a.o.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2011. – Vol.269, No.23. – p.2703-2708. – URL: http://dx.doi.org/10.1016/j.nimb.2011.08.015. – Bibliogr.:35.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$
Ristic, G.S.
The Sensitivity of 100 nm RADFETs with Zero Gate Bias up to Dose of 230 Gy(Si) / G.S.Ristic, [a.o.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2011. – Vol.269, No.23. – p.2703-2708. – URL: http://dx.doi.org/10.1016/j.nimb.2011.08.015. – Bibliogr.:35.
Спец.(статьи,препринты) = С 349.1 - Действие излучения на материалы$