Электронный каталог

Статья

Ogawa, Y.
Nanometer-Scale Mapping of the Strain and Ge Content of Ge/Si Quantum Dots Using Enhanced Raman Scattering by the Tip of an Atomic Force Microscope / Y.Ogawa, [a.o.] // Physical Review B : Condensed Matter and Materials Physics. – 2011. – Vol.83, No.8. – p.081302(R). – URL: http://dx.doi.org/10.1103/PhysRevB.83.081302. – Bibliogr.:26.



Спец.(статьи,препринты) = С 33 а - Нанофизика. Нанотехнология$