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Электронный каталог: Bloch, P. - Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology
Bloch, P. - Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology
Статья
Автор: Bloch, P.
IEEE Transactions on Nuclear Science: Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology
б.г.
ISBN отсутствует
Автор: Bloch, P.
IEEE Transactions on Nuclear Science: Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology
б.г.
ISBN отсутствует
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Статья
Bloch, P.
Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology / P.Bloch, A.Cheremukhin, I.Golutvin, N.Zamiatin, [a.o.] // IEEE Transactions on Nuclear Science. – 2002. – Vol.49,No.1,Pt.2. – p.321-325. – Bibliogr.:12.
Спец.(статьи,препринты) = С 344.1м - Полупроводниковые детекторы
ОИЯИ = ОИЯИ (JINR)2002
Bloch, P.
Investigation of Silicon Sensor Quality as a Function of the Ohmic Side Processing Technology / P.Bloch, A.Cheremukhin, I.Golutvin, N.Zamiatin, [a.o.] // IEEE Transactions on Nuclear Science. – 2002. – Vol.49,No.1,Pt.2. – p.321-325. – Bibliogr.:12.
Спец.(статьи,препринты) = С 344.1м - Полупроводниковые детекторы
ОИЯИ = ОИЯИ (JINR)2002
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IEEE Transactions on Nuclear Science Vol.49,No.1,Pt.2
The Institute of Electrical and Electronics Engineers, 02/2002 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ
IEEE Transactions on Nuclear Science Vol.49,No.1,Pt.2
The Institute of Electrical and Electronics Engineers, 02/2002 г.
ISBN отсутствует
Библиотека : ЦБ.ЧЗ